With scaling technology and increasing design sizes, power consumption during test and test data volume have grown dramatically — making it almost impossible to test an entire design once it ...
New Release Provides Support for Verilog2001 and a Wide Range of Usability Improvements across the Built-In Self-Test Product Line SAN JOSE, Calif. -- Aug. 21, 2007 -- LogicVision, Inc., a leading ...
Small geometries have projected IC technology into an era where test has become a crucial part in the chip design process and have introduced new challenges needing solutions that use already ...
It is often said that the emergence of the System-on-Chip will require fundamental changes in the approaches to design for testability (DFT.) These changes, it has been suggested, will take the form ...
The proliferation of semiconductor devices into safety-critical applications such as automotive and medical opens a new can of worms for test and reliability. An ever widening range of devices must ...
WILSONVILLE, USA: Mentor Graphics Corp. announced that STMicroelectronics has adopted the TestKompress automatic test pattern generation (ATPG) product into its standard 65nm and 45nm design kits. The ...
To keep up with time-to-market demands when SoCs keep increasing in size and complexity requires the adoption of better DFT flows and technologies. One of the most successful changes in ...
The trend in semiconductors leads to more IC test data volume, longer test times, and higher test costs. Embedded deterministic test (EDT) has continued to deliver more compression, which has been ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results