Embedded systems engineers face significant challenges in adding intelligence to myriad real-world applications. To succeed, they must select the proper tools to get their products ...

Automatic test-pattern generation (ATPG) has played a key role in semiconductor logic test, but several trends driving the need for semiconductor test quality are challenging traditional ATPG ...

MCRE will be the world’s first test of a fast-spectrum, salt-fueled reactor design. It is a public-private partnership led by ...

Built-in self-test is more than just test, it includes repair of failed circuits.

The recent Royal National Institute of Blind People ‘Design For Everyone’ campaign aims to acknowledge that people have a shared humanity, using the issue of pregnancy test results to ...