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Abstract Scanning electron microscopy (SEM) is of great significance for analyzing the ultrastructure. However, due to the requirements of data throughput and electron dose of biological samples in ...
A novel method of determining nanocluster sizes and size distributions using high-angle annular dark-field imaging in scanning transmission electron microscopy is described. This method is ...
Using full-field strain mapping and electrical measurements, this study outlines the electromechanical behavior of flexible strain sensors coated with graphene and clarifies the relationship between ...
Posted: June 4, 2025 | Last updated: June 14, 2025 Using a STEM-in-SEM conversion holder, we can convert a scanning electron microscope into a scanning transmission microscope. Neat!