Abstract Scanning electron microscopy (SEM) is of great significance for analyzing the ultrastructure. However, due to the requirements of data throughput and electron dose of biological samples in ...

Posted: June 20, 2025 | Last updated: June 20, 2025 Using a STEM-in-SEM conversion holder, we can convert a scanning electron microscope into a scanning transmission microscope. Neat!

The monolithic integration of CMOS integrated circuits with graphene holds significant potential for imaging beyond the visible range, low-power optical data communication on the chip, and the ...

Scanning Electron Microscopy (SEM) images often suffer from noise contamination, which degrades image quality and affects further analysis. This research presents a complete approach to estimate their ...

A novel method of determining nanocluster sizes and size distributions using high-angle annular dark-field imaging in scanning transmission electron microscopy is described. This method is ...