A TECHNIQUE has been developed for observing monochromatic Cathodoluminescence from semiconductors in the scanning electron microscope, enabling optical micro-analysis of materials to be carried ...
The optical light microscope MeF4M is used for examination of flat surfaces and for examination of materiallographic and metallographic sections. This research into the microstructure of materials. In ...
Results that may be inaccessible to you are currently showing.
Hide inaccessible results
Feedback